| Applications: |
| ASICs |
| Microprocessors / DSPs |
| ADCs/DACs |
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| HILEVEL |
| ETS868 Griffin Digital IC Tester |
| Purpose: |
| Production |
| Characterization |
| Failure Analysis |
| Incoming Inspection |
| Specifications： |
| Test rates up to 200MHz (100MHz All Modes) |
| Clocks up to 400MHz |
| Two strobes per cycle |
| 512 logic pins in ONE Chassis |
| Low Cost |
| 64M test vector depth with 4M high-speed buffer |
| 32 Timing Sets Global |
| Programmable loads and parallel loads |
| Multiple DC PMU units |
| Timing On-the-Fly |
| Mixed Signal Option |
| ±9mV Accuracy |
| ±8V, 150mA Source |
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上海信标科技发展有限公司1999-2005版权所有 |
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Copyright Shanghai
Sembridge Co.,Ltd. 2005. All rights reserved
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